SCAN928028TUFX Datasheet, National Semiconductor

n IEEE 1149.1 (JTAG) Compliant and At-Speed BIST test mode. n All 8 channels synchronous to one parallel clock rate, from 25 to 66 MHz n Duplicates function of multiple D.

Each serializer block in the SCAN928028 operates independently by using strobes from a single shared PLL. The SCAN92802.